Towards a Quality Metric for Dense Light Fields

Summary

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Authors: Vamsi Kiran Adhikarla, Marek Vinkler, Denis Sumin, Rafal K. Mantiuk, Karol Myszkowski, Hans-Peter Seidel, Piotr Didyk

Journal title: 2017 IEEE Conference on Computer Vision and Pattern Recognition (CVPR)

Journal number: Annual

Journal publisher: IEEE

Published year: 2017

Published pages: 3720-3729

DOI identifier: 10.1109/CVPR.2017.396

ISSN: 1063-6919