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Authors: Anna Maria Vollmer, Silverio Martinez-Fernandez, Alessandra Bagnato, Jari Partanen, Lidia Lopez, Pilar Rodriguez
Journal title: 2019 ACM/IEEE International Symposium on Empirical Software Engineering and Measurement (ESEM)
Journal publisher: IEEE
Published year: 2019
Published pages: 1-6
DOI identifier: 10.1109/esem.2019.8870162
ISBN: 978-1-7281-2968-6