Initial investigation on the impact of in situ hydrogen plasma exposure to the interface between molecular beam epitaxially grown p-Ga0.7In0.3Sb (100) and thermal atomic layer deposited (ALD) Al2O3

This is a publication. If there is no link to the publication on this page, you can try the pre-formated search via the search engines listed on this page.

Authors: Millar, D., Peralagu, U., Fu, Y.-C., Li, X., Steer, M., and Thayne, I.

Journal title: WoDIM

Journal number: Yearly; Session 4: III-V FETs

Journal publisher: http://wodim2016.imm.cnr.it/index.asp?cont=program

Published year: 2016

Published pages: N/A