Balanced Drive Currents in 10–20 nm Diameter Nanowire All-III-V CMOS on Si

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Authors: Adam Jonsson, Johannes Svensson, Lars-Erik Wemersson

Journal title: 2018 IEEE International Electron Devices Meeting (IEDM)

Journal publisher: IEEE

Published year: 2018

Published pages: 39.3.1-39.3.4

DOI identifier: 10.1109/iedm.2018.8614685

ISBN: 978-1-7281-1987-8