Low-Frequency Noise in III–V Nanowire TFETs and MOSFETs

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Authors: Markus Hellenbrand, Elvedin Memisevic, Martin Berg, Olli-Pekka Kilpi, Johannes Svensson, Lars-Erik Wernersson

Journal title: IEEE Electron Device Letters

Journal number: 38/11

Journal publisher: Institute of Electrical and Electronics Engineers

Published year: 2017

Published pages: 1520-1523

DOI identifier: 10.1109/led.2017.2757538

ISSN: 0741-3106