Electrical Properties of Vertical InAs/InGaAs Heterostructure MOSFETs

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Authors: Olli-Pekka Kilpi, Johannes Svensson, Erik Lind, Lars-Erik Wernersson

Journal title: IEEE Journal of the Electron Devices Society

Journal number: 7

Journal publisher: Institute of Electrical and Electronics Engineers Inc.

Published year: 2019

Published pages: 70-75

DOI identifier: 10.1109/jeds.2018.2878659

ISSN: 2168-6734