Integration of III–V nanowires for the next RF- and logic technology generation

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Authors: Lars-Erik Wernersson

Journal title: 2017 International Symposium on VLSI Technology, Systems and Application (VLSI-TSA)

Journal publisher: IEEE

Published year: 2017

Published pages: 1-2

DOI identifier: 10.1109/vlsi-tsa.2017.7942489

ISBN: 978-1-5090-5805-1