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Authors: V. Deshpande, H. Hahn, V. Djara, E. O'Connor, D. Caimi, M. Sousa, J. Fompeyrine, L. Czornomaz
Journal title: 2017 47th European Solid-State Device Research Conference (ESSDERC)
Journal publisher: IEEE
Published year: 2017
Published pages: 244-247
DOI identifier: 10.1109/essderc.2017.8066637
ISBN: 978-1-5090-5978-2
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