First InGaAs lateral nanowire MOSFET RF noise measurements and model

Summary

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Authors: Lars Ohlsson, Fredrik Lindelow, Cezar B. Zota, Matthias Ohlrogge, Thomas Merkle, Lars-Erik Wernersson, Erik Lind

Journal title: 2017 75th Annual Device Research Conference (DRC)

Journal publisher: IEEE

Published year: 2017

Published pages: 1-2

DOI identifier: 10.1109/drc.2017.7999451

ISBN: 978-1-5090-6328-4