InGaAs-on-Insulator FinFETs with Reduced Off-Current and Record Performance

This is a publication. If there is no link to the publication on this page, you can try the pre-formated search via the search engines listed on this page.

Authors: C. Convertino, C. Zota, S. Sant, F. Eltes, M. Sousa, D. Caimi, A. Schenk, L. Czornomaz

Journal title: 2018 IEEE International Electron Devices Meeting (IEDM)

Journal publisher: IEEE

Published year: 2018

Published pages: 39.2.1-39.2.4

DOI identifier: 10.1109/iedm.2018.8614640

ISBN: 978-1-7281-1987-8