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Authors: C. Convertino, D. Cutaia, H. Schmid, N. Bologna, P. Paletti, A.M. Ionescu, H. Riel, K. E. Moselund
Journal title: 2017 Joint International EUROSOI Workshop and International Conference on Ultimate Integration on Silicon (EUROSOI-ULIS)
Journal publisher: IEEE
Published year: 2017
Published pages: 148-151
DOI identifier: 10.1109/ulis.2017.7962586
ISBN: 978-1-5090-5313-1
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