Properties of III–V nanowires: MOSFETs and TunnelFETs

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Authors: Lars-Erik Wernersson

Journal title: 2017 Joint International EUROSOI Workshop and International Conference on Ultimate Integration on Silicon (EUROSOI-ULIS)

Journal publisher: IEEE

Published year: 2017

Published pages: 99-100

DOI identifier: 10.1109/ulis.2017.7962611

ISBN: 978-1-5090-5313-1