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Authors: H. Schmid, B. Mayer, J. Gooth, S. Wirths, L. Czornomaz, H. Riel, S. Mauthe, C. Convertino, K. E. Moselund
Journal title: 2017 IEEE SOI-3D-Subthreshold Microelectronics Technology Unified Conference (S3S)
Journal publisher: IEEE
Published year: 2017
Published pages: 1-3
DOI identifier: 10.1109/s3s.2017.8309200
ISBN: 978-1-5386-3766-1