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Authors: Amulf Leuther, Matthias Ohlrogge, Lukas Czornomaz, Thomas Merkle, Frank Bernhardt, Axel Tessmann
Journal title: 2017 IEEE MTT-S International Microwave Symposium (IMS)
Journal publisher: IEEE
Published year: 2017
Published pages: 1133-1136
DOI identifier: 10.1109/mwsym.2017.8058798
ISBN: 978-1-5090-6360-4
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