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Authors: Veeresh Deshpande, H. Hahn, E. O'Connor, Y. Baumgartner, D. Caimi, M. Sousa, H. Boutry, J. Widiez, L. Brevard, C. Le Royer, M. Vinet, J. Fompeyrine, L. Czornomaz
Journal title: IEEE Transactions on Electron Devices
Journal number: 64/11
Journal publisher: Institute of Electrical and Electronics Engineers
Published year: 2017
Published pages: 4503-4509
DOI identifier: 10.1109/ted.2017.2755662
ISSN: 0018-9383