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Authors: Olli-Pekka Kilpi, Jun Wu, Johannes Svensson, Erik Lind, Lars-Erik Wernersson
Journal title: 2017 Symposium on VLSI Technology
Journal publisher: IEEE
Published year: 2017
Published pages: T36-T37
DOI identifier: 10.23919/vlsit.2017.7998191
ISBN: 978-4-86348-605-8