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Authors: C. B. Zota, C. Convertino, V. Deshpande, T. Merkle, M. Sousa, D. Caimi, L. Czomomaz
Journal title: 2018 IEEE Symposium on VLSI Technology
Journal publisher: IEEE
Published year: 2018
Published pages: 165-166
DOI identifier: 10.1109/vlsit.2018.8510631
ISBN: 978-1-5386-4218-4