Monolithic integration of multiple III-V semiconductors on Si for MOSFETs and TFETs

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Authors: H. Schmid, D. Cutaia, J. Gooth, S. Wirths, N. Bologna, K. E. Moselund, H. Riel

Journal title: 2016 IEEE International Electron Devices Meeting (IEDM)

Journal number: Yearly

Journal publisher: IEEE

Published year: 2016

Published pages: 3.6.1-3.6.4

DOI identifier: 10.1109/IEDM.2016.7838340

ISBN: 978-1-5090-3902-9