Tunable Voltage Reference circuit in a standard 65nm CMOS technology

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Authors: Róbert Ondica, David Maljar, Miroslav Potočný, Daniel Arbet, Viera Stopjaková

Journal title: 2025 IEEE 28th International Symposium on Design and Diagnostics of Electronic Circuits and Systems (DDECS)

Journal publisher: IEEE

Published year: 2025

DOI identifier: 10.1109/DDECS63720.2025.11006809